William Q. Meeker
Named Chicago ASA Statistician of the Year
Award Dinner November 14
The Chicago Chapter of the American Statistical Association is pleased to announce William Q. Meeker as the 2006 Statistician of the Year. The Chapter’s Statistician of the Year is selected by a vote of past honorees, all of whom are internationally renowned members of the statistical community. Selection as a Chicago Chapter Statistician of the Year is a very significant honor.
Please help us welcome William Meeker into this select community at our Chapter dinner, November 14, 2006, at the Eastbank Club, at which he will accept the award and make a presentation to the Chapter on “Reliability Data Analysis Examples.”
William Meeker is a Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association, an elected member of the International Statistical Institute, and a past Editor of Technometrics. He is co-author of the books Statistical Methods for Reliability Data with Luis Escobar (1998), and Statistical Intervals: A Guide for Practitioners with Gerald Hahn (1991), four book chapters, and of numerous publications in the engineering and statistical literature. He and his co-authors have won the American Society for Quality (ASQ) Youden prize four times and the ASQ Wilcoxon Prize three times. In 2001, he and his co-author were recognized by the American Statistical Association for the Best Practical Application Award. He has consulted extensively on problems in reliability data analysis, reliability test planning, accelerated testing, nondestructive evaluation, and statistical computing.
Reliability assurance processes in manufacturing industries require data-driven information for making product-development decisions. Life tests, accelerated life tests, and accelerated degradation tests are commonly used to collect reliability data. Data from products in the field provide another important source of useful reliability information. Due to complications like censoring, these reliability studies typically yield data that require special statistical methods. This presentation will describe graphical outputs of the analyses of five different applications in the area of product reliability. Methods used in the analyses include Weibull and lognormal analysis, analysis of data with multiple failure modes, and the analysis of accelerated test data.
The dinner will be held at the Eastbank Club, 500 N Kingsbury, Chicago. Registration will begin at 6 p.m.; dinner will be served at 6:30 p.m. To make reservations, please complete the form below and mail with payment as directed. The cost of the dinner is $55 for ASA Chicago Chapter members and $60 for non-members.
Students who want to attend the dinner, but who have limited financial resources may apply for a Lucille Derrick fund subsidy of their registration fee. Please contact Jerry Enenstein if you would like to file for the student subsidy.