SPES Marquardt Memorial Industrial Speakers Program – List of Speakers
Last updated: April 2025
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Name
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Organization
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City, State
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Contact Info
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Chris Breen
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Eli Lilly and Company
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Indianapolis, IN
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317-651-4849
Breen_Christopher_C@Lilly.com
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Larry George
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Problem Solving Tools
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Livermore, CA
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925-447-4969
pstlarry@yahoo.com
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Kary Myers
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Los Alamos National Laboratory
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Santa Fe, NM
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505-606-1455
karymyers@gmail.com
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Wayne Nelson
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Wayne Nelson Statistical Consulting
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Schenectady, NY
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518-346-5138
wnconsult@aol.com
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Jorge Luis Romeu
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Syracuse University and IIT Research Institute
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Syracuse, NY
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315-476-8994
Jorge.Romeu@cortland.edu
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Philip R. Scinto
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Lubrizol
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Wickliffe, OH
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440-347-2161
phil.scinto@lubrizol.com
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Ryan Lekivetz
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JMP Statistical Discovery
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Cary, NC
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Ryan.Lekivetz@jmp.com
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Christopher C. Breen
Christopher has a BA (Mathematics, Secondary Education, and Computer Science) from Augustana College and an MS (Statistics) from the University of Iowa. He left the PhD program at Iowa to work in the semiconductor industry for thirteen years with Micron Technology and Samsung Semiconductor. He has been with Eli Lilly (a pharmaceutical manufacturer) in Indianapolis for over twenty years. In his many years of manufacturing experience, he has filled every role from Line Operator to Director of Statistics. He has been a Six Sigma Black Belt, a CQE, and an ISO 9000 auditor. Christopher brings a broad perspective to the Statistician’s role in modern manufacturing with deep experience in SPC, Design of Experiments, Measurement Systems, and Capability.
Possible seminar topics:
· Adding Value as a Manufacturing Statistician
· Measurement Systems – what every Statistician should know
· Purposeful SPC
· Five Graduate Courses You’ll Wish You Took
· Common Statistical Tools in Industry
· Bioassay – the hidden statistics
Contact info:
Christopher C. Breen
Director – Manufacturing Statistics
Eli Lilly and Company
Indianapolis, IN 46285
Phone: 317-651-4849
Breen_ Chris topher_C@Lilly.com
Larry George
Larry specializes in reliability statistics and their applications to hardware, software, and humans. If your local auto parts store doesn’t have the part you need, it could be Larry’s fault. Forced by the lack of age-at-failure data, he derived nonparametric reliability estimates from what the industry calls ships and returns counts. Fortunately, generally accepted accounting principles require ships and returns counts, so statistically sufficient data are available to estimate the field reliability of all products and service parts. The availability of field reliability statistics led to many productive applications in transportation, computers and electronics, sensors, medical, and even clinical trials for AIDS, hantavirus, and transplants.
Larry learned from the great statisticians at UC Berkeley while studying operations research. He taught for 11 years, worked for Lawrence Livermore National Laboratory for 11 years, and has over 20 years of reliability statistics experience in the real world, including industrial training experience.
Please refer to https://sites.google.com/site/fieldreliability/ for recent publications and links to other articles and presentations.
Potential Seminar Topics:
· Field Reliability Estimation Without Life Data
· Could Firestone and Ford Have Known?
· Actuarial forecasts, spares, and opportunistic maintenance
· Reliability vs. Uncertainty About Reliability
· Virtual Reliability, Virtual Statistics and Virtual Logistics
· Other, topics related to field reliability and its applications.
Contact Information:
Larry George, Ph.D. IE&OR
ASQ Fellow and Certified Reliability Engineer
Problem Solving Tools
Phone: 925-447-4969
pstlarry@yahoo.com
https://sites.google.com/site/fieldreliability/
Kary Myers
Education, Carnegie Mellon
PhD, Statistics
MS, Machine Learning
BS, Statistics with Computer Science Minor
Kary Myers is a fellow of the American Statistical Association and currently leads a group of ~40 scientists and R&D engineers in the Space Remote Sensing and Data Science Group at Los Alamos National Laboratory (LANL). With support from an AT&T Labs Fellowship, she earned her PhD from Carnegie Mellon’s Statistics and Data Science Department and her MS from their Machine Learning Department before joining LANL in 2006. She spent 15 years as a scientist in the Statistical Sciences Group at Los Alamos, including a few years as their deputy group leader and as the Deputy Director for Data Science in LANL’s Information Science and Technology Institute. She later served as LANL’s Program Manager for Data Science in the Intelligence and Emerging Threats Office. She’s been involved with a range of data-intensive projects, from analyzing electromagnetic measurements, to aiding large scale computer simulations, to developing analyses for chemical spectra from the Mars Science Laboratory Curiosity Rover. She served as an associate editor for the Annals of Applied Statistics and the Journal of Quantitative Analysis in Sports, and she created CoDA, the Conference on Data Analysis, to showcase data-driven research from across the Department of Energy. In 2024 she was awarded LANL’s Fellows’ Prize in Leadership in recognition of her successes creating inclusive communities that foster technical excellence, provide opportunities for early career researchers, and enable multidisciplinary, multiorganizational collaborations.
Contact information:
Email: karymyers@gmail.com
Phone: 505-412-5179
Wayne Nelson
Dr. Wayne Nelson is a leading expert on reliability data analysis and statistical methods for accelerated testing. He privately consults throughout Industry on diverse engineering and scientific applications of Statistics. His many applications include reliability data analysis, accelerated testing, quality control, measurement error analysis, planned experiments, sampling, and data analysis. He develops and presents Reliability and Statistics courses for companies, universities, and professional societies. He develops new statistical methods and computer programs. He also works as an expert witness
An employee of General Electric Corp. Research & Development for 25 years, he consulted across the company. As an adjunct professor at Union College and Rensselaer Polytechnic Inst., he taught graduate courses on theory and application of Statistics. Since 1990 he has been a private consultant and trainer.
He can be reached at WNconsult@aol.com.
Dr. Nelson authored the book Applied Life Data Analysis, published by Wiley in 1982 and translated into Japanese in 1988 by the Japanese Union of Scientists and Engineers. The ASA invited him to present this book in the only short course at the 1982 national meeting. In 1990, Wiley published his book Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, which he presented as an invited short course at the ASA 1990 national meeting. He authored the ASA-SIAM (2003) book Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. He presented invited short courses from it at the 2002 and 2004 Joint Statistical Meetings, the 2002 Deming Conference, and the 2006 Foro of the Mexican Statistical Assoc. (in Spanish). He has authored seven book chapters, two Amer. Soc. for Quality tutorial booklets (translated into Italian), and contributed to four technical standards of engineering societies.
The Amer. Statistical Assoc. elected him a Fellow in 1973 for contributions to reliability data analysis. He was elected to the ASA Council 1975-6, when he established and chaired the ASA Comm. on Presentation Awards (1976-9).
The ASA has awarded him nine Outstanding Presentation Awards for papers presented at the national Joint Statistical Meetings. In 1981 General Electric Corp. Research & Development presented him the Dushman Award for outstanding developments and applications of statistical methods for product reliability and accelerated test data. He received GE Corp. R&D Publications Awards in 1981 (100+) and 1985 (125+). The Amer. Soc. for Quality elected him a Fellow in 1983 for his innovative statistical methodologies. In 1988, the Inst. for Electrical and Electronics Engineers (IEEE) elected him a Fellow for his contributions to reliability and accelerated test data analysis and to reliability education, a rare honor for a statistician.
He was awarded the first NIST/ASA/NSF Senior Research Fellowship at the National Inst. of Standards and Technology (former National Bureau of Standards) to collaborate on modeling electromigration failure of microelectronics.
This fellowship was funded by the National Science Foundation and administered by the Amer. Statistical Assoc.
In 2001 he was awarded a Fulbright Award for research and lecturing (in Spanish) on reliability data analysis for the School of Engineering of the Universidad de Buenos Aires, Argentina’s leading engineering university, and for local engineering and statistical chapters. Since then he has annually given a series of seminars for the Univ. de Buenos Aires.
In 2004, the Amer. Soc. for Quality awarded him the Shewhart Medal for his technical leadership, in particular for innovative developments and applications of theory and methods for analyzing quality, reliability, and accelerated test data, and for widely disseminating such developments through his books and many publications, talks, and courses.
In 2005 the Reliability Society of the IEEE presented him the Lifetime Achievement Award, the Society’s most prestigious honor. He was the second person ever to receive this award. It recognizes his developments of methods for analyzing reliability and accelerated test data and his many contributions to reliability education through his books, articles, and courses.
Publications
Dr. Nelson authored the book Applied Life Data Analysis, published by Wiley in 1982 and translated into Japanese in 1988 by the Japanese Union of Scientists and Engineers. The ASA invited him to present this book in the only short course at the 1982 national meeting. In 1990, Wiley published his book Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, which he presented as an invited short course at the ASA 1990 national meeting. He authored the ASA-SIAM (2003) book Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. He presented invited short courses from it at the 2002 and 2004 Joint Statistical Meetings, the 2002 Deming Conference, and the 2006 Foro of the Mexican Statistical Assoc. (in Spanish). He has authored seven book chapters, two Amer. Soc. for Quality tutorial booklets (translated into Italian), and contributed to four technical standards of engineering societies. He has authored over 120 literature publications on statistical methods, mostly for engineering applications. For publications, he was awarded the 1969 Brumbaugh Award, the 1970 Youden Prize, and the 1972 Wilcoxon Prize, all of the Amer. Soc. for Quality.
Possible Seminar Topics
· Confidence limits for normal and lognormal distribution percentiles from singly censored samples
· BLUE methods for censored samples from (log)normal life distributions
· Exact limits for parameters of a normal distribution from singly censored samples
· Weibull analysis of reliability data with few or no failures
· Life data analysis in industry
· Benefits of switching to reduced sample inspection with poor quality history
· How to analyze reliability data with simple plots
· Confidence limits for the mean cumulative number of failures of a repairable product
· Hazard plotting of left truncated data
· How to estimate a standard deviation of measurement error from one measurement
· A nonparametric two-sample comparison for recurrence data – applied to repair data and disease recurrences
· A statistical model and computer program for analysis of data on the effect of specimen size on life, strength, and other properties – with an application to electromigration failure of microcircuit conductors
· Advances in accelerated testing
· Simple plots for recurrence data on product repair and disease recurrences
· A survey of accelerated test plans
· Repair data analysis with two measures of usage – applied to hours on and number of specimens processed by blood chemistry analyzers
· Defect initiation and growth – a general statistical model and data analyses
· Weibull prediction of a future number of failures
· How to make outstanding statistical presentations
· Important practical issues lacking in design of experiments courses – what you professor didn’t tell you
· Developing an efficient inventory reorder system
· Cost Optimal Sudden-Death Life Testing
· Analysis of Survival Data Or How Long Will my Pacemaker and Toaster Last?
· Birthrates of Statisticians – An Application of Recurrence Data Analysis
· Residuals and Their Analysis for Accelerated Life Tests with Step and Varying Stress
· Accelerated test prediction of fleet reliability of units under differing time-varying stresses in service
· Better Accelerated Tests
· A Bibliography of Accelerated Test Plans
· Graphical Analysis of Recurrent Events Data on Product Repairs, Disease Recurrences, and Other Applications
· Nonparametric Comparison of Sets of Repair Data
Contact info:
Dr. Wayne Nelson
739 Huntingdon Dr. , Schenectady , NY 12309
Phone: 518-346-5138
WNconsult@aol.com
Jorge Luis Romeu
Education:
Licenciado en Math-Stats (BS), University of Havana, Cuba, 1973
MS, Operations Research, Syracuse University, NY, 1982
Ph.D. Operations Research, Syracuse University, NY, 1990
Jorge is an Emeritus SUNY faculty and a Part Time Professor with the Mechanical and Aerospace Engineering Dept., Syracuse University. He is a Senior Fulbright Scholar, and has developed teaching assignments in Mexico, Dominican Republic, Ecuador and Colombia.
Jorge worked over ten years for IIT Research Institute, in the Reliability Analysis Center (RAC), where he developed statistical material and taught reliability statistics courses for practicing engineers, as well as consulted on reliability and quality issues.
Jorge has developed several webinars for ASQ, on industrial statistics topics such as system modeling with Markov Chains, reliability, availability, quality control, and statistical modeling and data analysis. See: https://web.cortland.edu/romeu/ and https://www.researchgate.net/profile/Jorge-Romeu-2
Jorge directs the Juarez Lincoln Marti (http://web.cortland.edu/matresearch) International Education Project and its Quality and Reliability Institute https://web.cortland.edu/matresearch/QR&CIInstPg.htm
Jorge is a retired Chartered Statistician Fellow of the Royal Statistical Society, a Member of ASA and a Senior Member of ASQ.
Contact info:
Email: romeu@cortland.edu
Phone: 315-476-8994
Philip R. Scinto
Mr. Philip R. Scinto is a Senior Technical Fellow for the Lubrizol Corporation, and a Fellow of the American Statistical Association. Mr. Scinto holds a M.S. (1987), Carnegie Mellon University, in Statistics, and a B.S. (1986), Cornell University, in Statistics & Biometry. He is known for: applying innovative statistical solutions in industry; practical applied research in supersaturated designs and statistical engineering; and predictive modeling through transfer learning. Mr. Scinto’s accomplishments in the engine oil industry include the founding and developing of the worldwide control charting system for engine calibration known as the “Lubricant Test Monitoring System”, the statistical treatment of product approval data known as “Multiple Test Evaluation Procedures”, an experimental design approach to Industry Matrix testing, a data-based single technology approach to Base Oil Interchange known as “The Single Technology Matrix”, and “virtual” product testing through predictive models. He is also responsible for the development and co-management of a comprehensive formulation modeling and optimization system accessible on the Lubrizol Information Warehouse (Q.LIFE®).
Contact info:
The Lubrizol Corporation
Drop # 152B
29400 Lakeland Blvd.
Wickliffe , OH 44092-2298
phil.scinto@lubrizol.com
Phone: 440-347-2161
Ryan Lekivetz
Ryan Lekivetz is a Director of Advanced Analytics R&D at JMP Statistical Discovery LLC, heading the Design of Experiments (DOE) and Reliability Development team. Lekivetz earned his PhD (2011) and MSc (2006) in statistics from Simon Fraser University in Burnaby, British Columbia and BSc in Mathematics and Computer Science from University of Regina (2004). He has published papers on DOE topics in peer-reviewed journals and holds many patents that he shares with his team members. His research interests include design of experiments, combinatorial testing, and assessing the usability of statistical software through designed experiments.
You can find him on LinkedIn at https://www.linkedin.com/in/ryanlekivetz/.
Possible Seminar topics can range from theoretical to applied:
- Modern Screening Designs
- Testing Statistical Software as a Designed Experiment
- Thoughts from a statistician working in industry
Contact info:
Email: Ryan.Lekivetz@jmp.com